LAB 40 M Series Microscope

LAB 40 M is a new generation metallographic microscope, based on the LAB 40 model.

High quality optics, bright, adjustable reflected and transmitted LED light and the possibility to observe in bright field technique and polarized light make the LAB 40 M a perfect device for metallographic research both in industry and education.

Pictures taken with a microscope

Technical parameters

Parameter Detailed description
Optics Infinity-corrected optical system
Viewing head Binocular or trinocular (optional). Adjustable interpupilary distance: 54-75 mm. Eyepiece inclination: 300. Dioptric correction: +/- 5 diopters in left eyepiece (binocular viewing head) or in both eyepieces (trinocular viewing head).
Eyepieces Wide field of view PL10X/22 mm
Revolving nosepiece Quintuple
Objectives Plan achromatic LWD objectives:  5x, 10x, 20x, 50x, 100x
Condenser N.A.0.9 (SWING) condenser
Focus adjustment Coaxial coarse and fine focus adjustment knob with coarse focus movement tension adjustment. Movement range: 28 mm. Movement precision: 0,002 mm.
Stage Double layers mechanical stage with convenient, vertical XY manipulators. Dimensions:  175 x 145 mm . Movement range: 76×42 mm.
Max. specimen height: 78 mm (reflected light base) or 28 mm (reflected and transmitted light base).
Glass specimen plate for transmitted and reflected light base; metal specimen plate for reflected light base.
Illumination Reflected light module: warm, adjustable 5W LED light with field and aperture diaphragm.
Transmitted light: warm, adjustable 5W LED light.

Files to download